EEs Talk Tech
EEs Talk Tech
Daniel Bogdanoff
The Huge Challenge of Testing USB 3.2 – #33
23 minutes Posted Aug 23, 2018 at 4:00 pm.
0:00
23:08
Download MP3
Show notes
USB 3.2 doubles the data rate of previous USB specs, but makes the testing process significantly harder. Find out why in this electrical engineering podcast.